Pages: pp. 86-87
Abstract—This month's TTTC newsletter features synopses of past events and of upcoming events.
Keywords—ITC 2010, ATS 2010, DATE 2011, LATW 2011
31 October–5 November 2010
From its beginnings as an informal gathering of engineers in 1970 at Cherry Hill, New Jersey, ITC has grown into the Test Week event, with more than a hundred papers, panels, tutorials, workshops, lecture series sessions, and case studies, in addition to an exhibition, poster session, and important keynote and invited speeches. ITC 2010 was held in Austin, Texas. James Truchard, CEO and cofounder of National Instruments, gave the keynote address. John Cohn, Fellow and Chief Scientist of design automation at IBM, and Philip Wong, professor of electrical engineering at Stanford University, were the two invited speakers. The technical program consisted of 25 sessions with 72 technical papers and 19 lecture series papers. Test Week closed with three exciting workshops. The 3D workshop addressed various challenges related to 3D test. The high-speed analog circuits workshop addressed test and validation issues concerning high-speed analog circuits. Finally, the defect and data-driven testing workshop explored the latest developments in defect-based testing.
1–4 December 2010
ATS 2010, held in Shanghai, China, was the 19th in this series of symposia started in 1992 that are devoted to testing and fault-tolerant computing. ATS is now recognized as the primary event for covering many dimensions of testing for computing systems. Following tradition, this year's ATS, organized by Shanghai University, aims at providing a more open forum for worldwide researchers and industrial practitioners to exchange their innovative ideas on testing technology for both hardware and software in computing systems. The ATS 2010 program featured two keynote speeches, multiple technical sessions, one panel, and a special session of doctoral contest. Ajay Bose of Atrenta and R. Keith Lee of Advantest delivered the keynote speeches. The panel session addressed the topic of "Testing Nanoelectronic Circuits under Massive Statistical Process Variations."
14–18 March 2011
Grenoble, France, is a key semiconductor site in Europe and a major industrial and scientific center for micro- and nano-electronics, making it a perfect site for hosting the DATE 2011 conference and commercial exhibition. The DATE technical program will encompass various topics addressing the latest in the design and engineering of electronic systems and embedded software. The conference includes 7 tutorial tracks, 57 technical program sessions, and an executive track featuring 3 sessions with industry-leading executives. DATE 2011 will feature two special focus days devoted to topics of outstanding importance to industry and academia. Special Day 1 will examine "Smart Devices of the Future," and Special Day 2 will explore "Intelligent Energy Management: Supply and Utilization." Each specially themed day will dedicate a full-day program of keynotes, panels, tutorials, and technical presentations to each of the two themes. The final DATE program will consist of several hundreds of papers selected from a total of approximately 950 submissions.
27–30 March 2011
Porto de Galinhas, Brazil
The IEEE Latin-American Test Workshop (LATW) provides an annual forum for test and fault tolerance professionals and technologists from all over the world and, in particular, from Latin America to present and discuss various aspects of system, board, and component testing and fault tolerance with design, manufacturing, and field considerations in mind. This year, LATW will be held in Porto de Galinhas, Brazil. In addition to the technical program and tutorials, LATW will feature invited talks in six special sessions. The sessions are "Low-Power and Thermal-Aware Design and Test"; "Radiation Effects on ICs"; "Analog and Mixed-Signal Test and Diagnosis"; "Design and Test of Reliable Software for Embedded Systems"; "Design of ICs for Electromagnetic Robustness"; and "Design Verification/Validation Methods and Tools." LATW Presenters of the best LATW 2011 papers will be invited to resubmit to IEEE Design and Test and to the Journal of Electronic Testing, Theory and Applications (JETTA).
I would appreciate input and suggestions about the newsletter from the test community. Please forward your ideas, contributions, and information on awards, conferences, and workshops to Partha Pande, School of Electrical Engineering and Computer Science, Washington State University, PO Box 642752, Pullman, WA 99164-2752; email@example.com.
Editor, TTTC Newsletter
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