Issue No. 01 - January/February (2011 vol. 28)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2011.20
Yuan Xie , Pennsylvania State University
<p>Editor's note:</p><p>Spin-transfer torque RAM and phase-change RAM are vying to become the next-generation embedded memory, offering high speed, high density, and nonvolatility. This article discusses new opportunities and challenges presented by these two memory technologies with a particular emphasis on modeling and architecture design.</p><p align="right">—Chris H. Kim, University of Minnesota</p>
design and test, memory technologies, memory hierarchy, nonvolatile memory, NVM, SRAM, eDRAM, RRAM, STT-RAM, PCRAM
Y. Xie, "Modeling, Architecture, and Applications for Emerging Memory Technologies," in IEEE Design & Test of Computers, vol. 28, no. , pp. 44-51, 2011.