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Issue No. 01 - January/February (2011 vol. 28)
ISSN: 0740-7475
pp: 44-51
Yuan Xie , Pennsylvania State University
<p>Editor's note:</p><p>Spin-transfer torque RAM and phase-change RAM are vying to become the next-generation embedded memory, offering high speed, high density, and nonvolatility. This article discusses new opportunities and challenges presented by these two memory technologies with a particular emphasis on modeling and architecture design.</p><p align="right">&#x2014;Chris H. Kim, University of Minnesota</p>
design and test, memory technologies, memory hierarchy, nonvolatile memory, NVM, SRAM, eDRAM, RRAM, STT-RAM, PCRAM
Yuan Xie, "Modeling, Architecture, and Applications for Emerging Memory Technologies", IEEE Design & Test of Computers, vol. 28, no. , pp. 44-51, January/February 2011, doi:10.1109/MDT.2011.20
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