Issue No. 01 - January/February (2011 vol. 28)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2011.21
Chris H. Kim , University of Minnesota
Leland Chang , IBM T.J. Watson Research Center
<p>This special issue presents seven articles that examine the characteristics, capabilities, and challenges of various embedded memories, especially those designed in emerging technologies. The articles address the intricacies and trade-offs required by designers when faced with scaling and power constraints.</p>
design and test, embedded memories, PCRAM, SRAM, DRAM, eDRAM, FeRAM, MRAM, STT-RAM
C. H. Kim and L. Chang, "Nanoscale Memories Pose Unique Challenges," in IEEE Design & Test of Computers, vol. 28, no. , pp. 6-8, 2011.