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Issue No. 01 - January/February (2011 vol. 28)
ISSN: 0740-7475
pp: 6-8
Chris H. Kim , University of Minnesota
Leland Chang , IBM T.J. Watson Research Center
ABSTRACT
<p>This special issue presents seven articles that examine the characteristics, capabilities, and challenges of various embedded memories, especially those designed in emerging technologies. The articles address the intricacies and trade-offs required by designers when faced with scaling and power constraints.</p>
INDEX TERMS
design and test, embedded memories, PCRAM, SRAM, DRAM, eDRAM, FeRAM, MRAM, STT-RAM
CITATION
Chris H. Kim, Leland Chang, "Nanoscale Memories Pose Unique Challenges", IEEE Design & Test of Computers, vol. 28, no. , pp. 6-8, January/February 2011, doi:10.1109/MDT.2011.21
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