Issue No. 01 - January/February (2011 vol. 28)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2011.15
<p>This issue of D&T features seven articles on the future landscape of embedded memories. The articles address emerging memories and the unique challenges of nanoscale memory technologies.</p>
design and test, embedded memory, eDRAM, SRAM, PCRAM, MRAM, STT-RAM, emerging memories
"Embedded memory technologies: Present and future," in IEEE Design & Test of Computers, vol. 28, no. , pp. 4, 2011.