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Issue No. 01 - January/February (2011 vol. 28)
ISSN: 0740-7475
pp: 4
<p>This issue of D&#x0026;T features seven articles on the future landscape of embedded memories. The articles address emerging memories and the unique challenges of nanoscale memory technologies.</p>
design and test, embedded memory, eDRAM, SRAM, PCRAM, MRAM, STT-RAM, emerging memories
"Embedded memory technologies: Present and future", IEEE Design & Test of Computers, vol. 28, no. , pp. 4, January/February 2011, doi:10.1109/MDT.2011.15
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