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Issue No. 06 - November/December (2010 vol. 27)
ISSN: 0740-7475
pp: 72-73
ABSTRACT
<p>This is a review of <it>Power-Aware Testing and Test Strategies for Low Power Devices</it> (Patrick Girard, Nicola Nicolici, and Xiapqing Wen, eds.).</p>
INDEX TERMS
design and test, literature survey, power-aware testing, low power, test strategies
CITATION
"About the power problem", IEEE Design & Test of Computers, vol. 27, no. , pp. 72-73, November/December 2010, doi:10.1109/MDT.2010.122
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