The Community for Technology Leaders
Green Image
Issue No. 06 - November/December (2010 vol. 27)
ISSN: 0740-7475
pp: 72-73
ABSTRACT
<p>This is a review of <it>Power-Aware Testing and Test Strategies for Low Power Devices</it> (Patrick Girard, Nicola Nicolici, and Xiapqing Wen, eds.).</p>
INDEX TERMS
design and test, literature survey, power-aware testing, low power, test strategies
CITATION

"About the power problem," in IEEE Design & Test of Computers, vol. 27, no. , pp. 72-73, 2010.
doi:10.1109/MDT.2010.122
79 ms
(Ver 3.3 (11022016))