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Issue No. 06 - November/December (2010 vol. 27)
ISSN: 0740-7475
pp: 36-45
Rajiv Joshi , IBM Corporation,
Rouwaida Kanj , IBM, round Rock
Anthony Pelella , IBM Corporation,
Arthur tuminaro , IBM Corporation,
Yuen Chan , IBM Corporation,
<p><it>Editor's note:</it></p><p>Statistical approaches for yield estimation and robust design are vital in the current variation-dominated design era. This article presents a mixture importance sampling methodology to enable yield-driven design and extends its application beyond memories to peripheral circuits and logic blocks.</p><p align="right"><it>&#x2014;Rahul Rao, IBM</it></p>
design and test, DFM, memory, logic, yield, test, variation-tolerant designs

R. Joshi, Y. Chan, R. Kanj, A. tuminaro and A. Pelella, "The Dawn of Predictive Chip Yield Design: Along and Beyond the Memory Lane," in IEEE Design & Test of Computers, vol. 27, no. , pp. 36-45, 2010.
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