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Issue No. 06 - November/December (2010 vol. 27)
ISSN: 0740-7475
pp: 18-25
Wu-Hsin Chen , Purdue University
Byunghoo Jung , Purdue University
<p><it>Editor's note:</it></p><p>Despite their inherent self-healing nature, noise (jitter) in phase-locked loops is sensitive to process and environmental variation. This article discusses automatic frequency calibration and amplitude control techniques that rely on a negative feedback loop with a large emphasis on digitally assisted calibration.</p><p align="right"><it>&#x2014;Rahul Rao, IBM</it></p>
design and test, phase-locked loop, self-healing, noise control, automatic amplitude control, digital-feedback control, yield improvement
Wu-Hsin Chen, Byunghoo Jung, "Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies", IEEE Design & Test of Computers, vol. 27, no. , pp. 18-25, November/December 2010, doi:10.1109/MDT.2010.138
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