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Issue No. 06 - November/December (2010 vol. 27)
ISSN: 0740-7475
pp: 6-17
Vishwanath Natarajan , Georgia Institute of Technology
Shreyas Sen , Georgia Institute of Technology
Aritra Banerjee , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
Ganesh Srinivasan , Texas Instruments
Friedrich Taenzler , Texas Instruments
<p><it>Editor's note:</it></p><p>Tuning knobs are becoming common in analog and RF devices for postsilicon calibration for variation tolerance and compensation. This article presents a low-cost, hardware-iterative technique based on a steepest-descent-based gradient search algorithm and demonstrates its utility in performance tuning of a 2.4-GHz transmitter system.</p><p align="right"><it>&#x2014;Rahul Rao, IBM</it></p>
design and test, RF system, submicron technology, process variation, yield improvement, self tuning, postmanufacture tuning, analog tuning, optimization, tuning knobs, manufacturing cost

G. Srinivasan, S. Sen, F. Taenzler, V. Natarajan, A. Banerjee and A. Chatterjee, "Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems," in IEEE Design & Test of Computers, vol. 27, no. , pp. 6-17, 2010.
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