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Issue No. 06 - November/December (2010 vol. 27)
ISSN: 0740-7475
pp: 6-17
Ganesh Srinivasan , Texas Instruments
Shreyas Sen , Georgia Institute of Technology
Friedrich Taenzler , Texas Instruments
Vishwanath Natarajan , Georgia Institute of Technology
Aritra Banerjee , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
ABSTRACT
<p><it>Editor's note:</it></p><p>Tuning knobs are becoming common in analog and RF devices for postsilicon calibration for variation tolerance and compensation. This article presents a low-cost, hardware-iterative technique based on a steepest-descent-based gradient search algorithm and demonstrates its utility in performance tuning of a 2.4-GHz transmitter system.</p><p align="right"><it>&#x2014;Rahul Rao, IBM</it></p>
INDEX TERMS
design and test, RF system, submicron technology, process variation, yield improvement, self tuning, postmanufacture tuning, analog tuning, optimization, tuning knobs, manufacturing cost
CITATION
Ganesh Srinivasan, Shreyas Sen, Friedrich Taenzler, Vishwanath Natarajan, Aritra Banerjee, Abhijit Chatterjee, "Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems", IEEE Design & Test of Computers, vol. 27, no. , pp. 6-17, November/December 2010, doi:10.1109/MDT.2010.123
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