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Issue No.06 - November/December (2010 vol.27)
pp: 6-17
Vishwanath Natarajan , Georgia Institute of Technology
Shreyas Sen , Georgia Institute of Technology
Aritra Banerjee , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
Ganesh Srinivasan , Texas Instruments
Friedrich Taenzler , Texas Instruments
<p><it>Editor's note:</it></p><p>Tuning knobs are becoming common in analog and RF devices for postsilicon calibration for variation tolerance and compensation. This article presents a low-cost, hardware-iterative technique based on a steepest-descent-based gradient search algorithm and demonstrates its utility in performance tuning of a 2.4-GHz transmitter system.</p><p align="right"><it>&#x2014;Rahul Rao, IBM</it></p>
design and test, RF system, submicron technology, process variation, yield improvement, self tuning, postmanufacture tuning, analog tuning, optimization, tuning knobs, manufacturing cost
Vishwanath Natarajan, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, "Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems", IEEE Design & Test of Computers, vol.27, no. 6, pp. 6-17, November/December 2010, doi:10.1109/MDT.2010.123
1. P. Capozio et al., "A Novel Adaptive Technique for Digital I/Q Imbalance Compensation in OFDM Receivers," Proc. IEEE Int'l Conf. Acoustics, Speech and Signal Processing (ICASSP 05), vol. 3, IEEE Press, 2005, pp. 817-820.
2. G.-J. Van Rooyen and J.G. Lourens, "Non-iterative Compensation for Software-Defined Radio Quadrature Front-End Inaccuracies," Proc. Wireless Communications, Networking and Mobile Computing (WiCOM 05), vol. 1, IEEE Press, 2005, pp. 598-601.
3. D. Han et al., "On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-in Self Test (S-BIST)," Proc. 11th Int'l On-Line Testing Symp. (OLTS 05), IEEE CS Press, 2005, pp. 106-111.
4. M.A.I. Elmala and S.H.K. Embabi, "A Self-Calibration Technique for Mismatches in Image-Reject Receivers," Proc. Custom Integrated Circuits Conf. (CICC 02), IEEE Press, 2002, pp. 251-254.
5. R. Voorakaranam, S. Cherubal, and A. Chatterjee, "A Signature Test Framework for Rapid Production Testing of RF Circuits," Proc. Design, Automation and Test in Europe (DATE 02), IEEE CS Press, 2002, pp. 4-8.
6. R. Senguttuvan and A. Chatterjee, "Alternate Diagnostic Testing and Compensation of RF Transmitter Performance Using Response Detection," Proc. VLSI Test Symp. (VTS 07), IEEE CS Press, 2007, pp. 395-400.
7. D. Han, B.S. Kim, and A. Chatterjee, "DSP-Driven Self-Tuning of RF Circuits for Process-Induced Performance Variability," IEEE Trans. Very Large Scale Integration (VLSI) Systems, vol. 18, no. 2, 2010, pp. 305-314.
8. V. Natarajan et al., "BIST Driven Power Conscious Post-Manufacture Tuning of Wireless Transceiver Systems Using Hardware-Iterated Gradient Search," Proc. Asian Test Symp. (ATS 09), IEEE CS Press, 2009, pp. 243-248.
9. S. Devarakond et al., "BIST-Assisted Power Aware Self Healing RF Circuits," IEEE Mixed-Signal Sensors and Systems Test Workshop, IEEE CS Press, 2009, pp. 1-4.
10. V. Natarajan et al., "A Holistic Approach to Accurate Tuning of RF Systems for Large and Small Multiparameter Perturbations," Proc. VLSI Test Symp. (VTS 10), IEEE CS Press, 2010, pp. 331-336.
11. V. Natarajan et al., "ACT: Adaptive Calibration Test for Performance Enhancement and Increased Testability of Wireless RF Front-Ends," Proc. VLSI Test Symp. (VTS 08), IEEE CS Press, 2008, pp. 215-220.
12. S.C. Chapra and R.P. Canale, Numerical Methods for Engineers, 4th ed., McGraw-Hill, 2001, pp. 342-349.
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