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Issue No. 06 - November/December (2010 vol. 27)
ISSN: 0740-7475
pp: 4-5
Swarup Bhunia , Case Western Reserve University
Rahul Rao , IBM T.J. Watson Research Center
ABSTRACT
<p>This special issue presents six articles that highlight challenges, and approaches toward improving, design yield and reliability through postsilicon optimizations. The articles cover postsilicon adaptation and repair issues in a wide range of areas including analog circuits, embedded memories, and multicore systems.</p>
INDEX TERMS
design and test, built-in self-repair, calibration, many-core, multicore, postsilicon optimization, reliability, self-repair, thermal management, yield improvement
CITATION

S. Bhunia and R. Rao, "Guest Editors' Introduction: Managing Uncertainty through Postfabrication Calibration and Repair," in IEEE Design & Test of Computers, vol. 27, no. , pp. 4-5, 2010.
doi:10.1109/MDT.2010.134
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