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ABSTRACT
<p>This issue of <it>D&#x0026;T</it> features six articles on postsilicon calibration and repair. The articles span both design and test aspects of chip and system design, and highlight the interplay between design and test solutions.</p>
INDEX TERMS
design and test, calibration and repair, low-power, mixed-signal, postsilicon tuning, parameter variation, process variation, yield and reliability
CITATION

K. Chakrabarty, "Increasing yield and reliability through postsilicon tuning," in IEEE Design & Test of Computers, vol. 27, no. , pp. 2, 2010.
doi:10.1109/MDT.2010.135
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