Issue No. 06 - November/December (2010 vol. 27)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2010.135
<p>This issue of <it>D&T</it> features six articles on postsilicon calibration and repair. The articles span both design and test aspects of chip and system design, and highlight the interplay between design and test solutions.</p>
design and test, calibration and repair, low-power, mixed-signal, postsilicon tuning, parameter variation, process variation, yield and reliability
K. Chakrabarty, "Increasing yield and reliability through postsilicon tuning," in IEEE Design & Test of Computers, vol. 27, no. , pp. 2, 2010.