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Issue No. 06 - November/December (vol. 27)
ISSN: 0740-7475
From the EIC

Table of Contents (PDF)

pp. c2
Postsilicon Calibration and Repair for Yield and Reliability Improvement

Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems (Abstract)

Ganesh Srinivasan , Texas Instruments
Shreyas Sen , Georgia Institute of Technology
Friedrich Taenzler , Texas Instruments
Vishwanath Natarajan , Georgia Institute of Technology
Aritra Banerjee , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
pp. 6-17

Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies (Abstract)

Wu-Hsin Chen , Purdue University
Byunghoo Jung , Purdue University
pp. 18-25

Postsilicon Adaptation for Low-Power SRAM under Process Variation (Abstract)

Jason Schlessman , Princeton University
Saibal Mukhopadhyay , Georgia Institute of Technology
Minki Cho , Georgia Institute of Technology
Marilyn Wolf , Georgia Institute of Technology
Hamid Mahmoodi , San Francisco State University
pp. 26-35

The Dawn of Predictive Chip Yield Design: Along and Beyond the Memory Lane (Abstract)

Rajiv Joshi , IBM Corporation,
Yuen Chan , IBM Corporation,
Rouwaida Kanj , IBM, round Rock
Arthur tuminaro , IBM Corporation,
Anthony Pelella , IBM Corporation,
pp. 36-45

A Built-in Method to Repair SoC RAMs in Parallel (Abstract)

Jin-Fu Li , National Central University
Chih-Sheng Hou , National Central University
Tsu-Wei Tseng , National Central University
pp. 46-57

Runtime Thermal Management Using Software Agents for Multi- and Many-Core Architectures (Abstract)

Mohammad Al Faruque , CES:Chair for Embedded Systems , Karlsruhe
Joerg Henkel , University of Karlsruhe, Karlsruhe
Janmartin Jahn , Karlsruhe Institute of Technology, Karlsruhe
pp. 58-68
Conference Reports and Panel Summaries

Conference Reports (HTML)

pp. 70-71
Book Reviews

About the power problem (HTML)

pp. 72-73
CEDA Currents

CEDA Currents (HTML)

pp. 74-75
DATC Newsletter
TTTC Newsletter
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