Issue No. 05 - September/October (2010 vol. 27)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2010.113
Ron Press , Mentor Graphics
Erik Volkerink , Verigy
<p>This year's <scp>ITC</scp>, to be held 31 October–5 November in Austin, Texas, will explore the frontiers of test, through advanced research topics and case studies. Additionally, a basic tutorial will cover the fundamentals of test. Panel discussions will focus on why some analog test technologies are taking so long to be adopted, and will provide methods for chip bring-up. An Advanced Industrial Practices session will cover current best practices.</p>
design and test, ITC 2010
R. Press and E. Volkerink, "The ABCs of ITC," in IEEE Design & Test of Computers, vol. 27, no. , pp. 80, 2010.