Issue No. 05 - September/October (2010 vol. 27)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2010.102
<p>The Conference Report reviews the First International Workshop on Reliability Aware System Design and Test (RASDAT) held with the 2010 International Conference on VLSI Design.</p>
design and test, modeling, RASDAT
"Conference Reports," in IEEE Design & Test of Computers, vol. 27, no. , pp. 72-73, 2010.