The Community for Technology Leaders
Green Image
Issue No. 05 - September/October (2010 vol. 27)
ISSN: 0740-7475
pp: 50-59
Alodeep Sanyal , Synopsys
Syed M. Alam , Everspin Technologies
Sandip Kundu , University of Massachusetts at Amherst
<p>The continual scaling of device dimensions is increasing both parametric failures, stemming from circuit marginality issues, and soft errors, from the impact of high-energy particles on semiconductor surfaces. Effectively detecting and estimating such intermittent failures is crucial for reliability, availability, and serviceability (RAS) characterization of chips. This BIST-based approach distinguishes intermittent failures from permanent failures and reduces test time and cost.</p>
design and test, soft error, parametric failure, BIST, linear feedback shift register, multiple input signature register

S. Kundu, A. Sanyal and S. M. Alam, "BIST to Detect and Characterize Transient and Parametric Failures," in IEEE Design & Test of Computers, vol. 27, no. , pp. 50-59, 2010.
83 ms
(Ver 3.3 (11022016))