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Issue No. 05 - September/October (2010 vol. 27)
ISSN: 0740-7475
pp: 50-59
Sandip Kundu , University of Massachusetts at Amherst
Alodeep Sanyal , Synopsys
Syed M. Alam , Everspin Technologies
ABSTRACT
<p>The continual scaling of device dimensions is increasing both parametric failures, stemming from circuit marginality issues, and soft errors, from the impact of high-energy particles on semiconductor surfaces. Effectively detecting and estimating such intermittent failures is crucial for reliability, availability, and serviceability (RAS) characterization of chips. This BIST-based approach distinguishes intermittent failures from permanent failures and reduces test time and cost.</p>
INDEX TERMS
design and test, soft error, parametric failure, BIST, linear feedback shift register, multiple input signature register
CITATION
Sandip Kundu, Alodeep Sanyal, Syed M. Alam, "BIST to Detect and Characterize Transient and Parametric Failures", IEEE Design & Test of Computers, vol. 27, no. , pp. 50-59, September/October 2010, doi:10.1109/MDT.2010.30
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