The Community for Technology Leaders
RSS Icon
Issue No.05 - September/October (2010 vol.27)
pp: 36-49
Michele Portolan , Bell Labs Ireland
Suresh Goyal , Alcatel-Lucent Bell Labs
Bradford Van Treuren , Alcatel-Lucent Bell Labs
Chen-Huan Chiang , Alcatel-Lucent Bell Labs
Tapan J. Chakraborty , Alcatel-Lucent Bell Labs
Thomas B. Cook , Alcatel-Lucent Bell Labs
<p>This article describes the New Scan Description Language (NSDL), which can efficiently describe embedded-testing resources for automated test generation. The authors evaluate NSDL in the context of the proposed IEEE P1687 standard. They conduct a theoretical analysis for each requirement of this standard and identify the NSDL code solution for each point. They also explain how NSDL naturally fits into an automated test flow.</p>
design and test, test generation, languages, built-in tests, testing strategies, testing tools, NSDL, IEEE P1687
Michele Portolan, Suresh Goyal, Bradford Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook, "A Common Language Framework for Next-Generation Embedded Testing", IEEE Design & Test of Computers, vol.27, no. 5, pp. 36-49, September/October 2010, doi:10.1109/MDT.2010.1
1. IEEE Std. 1149.1-2001, IEEE Standard Test Access Port and Boundary-Scan Architecture, IEEE, 2001.
2. IJTAG – IEEE P1687;
3. The System JTAG Working Group; http:/
4. Serial Vector Format Specification, revision E, part no. ASSET-SVF-DOC, Asset InterTech, 8 Mar. 1999; .
5. Standard Test and Programming Language, JESD-71, Joint Electron Devices Eng. Council, Aug. 1999.
6. J. Rearick and A. Volz, "A Case Study of Using IEEE P1687 (IJTAG) for High-Speed Serial I/O Characterization and Testing," Proc. Int'l Test Conf. (ITC 06), vol. 1, IEEE CS Press, 2006, pp. 314-321.
7. K. Posse et al., "IEEE P1687: Toward Standardized Access of Embedded Instrumentation," Proc. Int'l Test Conf. (ITC 06), vol. 2, IEEE CS Press, 2006, pp. 1045-1052.
8. A.L. Crouch, "IJTAG: The Path to Organized Instrument Connectivity," Proc. Int'l Test Conf. (ITC 07), vol. 2, IEEE CS Press, 2007, pp. 922-931.
9. J. Doege and A.L. Crouch, "The Advantages of Limiting P1687 to a Restricted Subset," Proc. Int'l Test Conf. (ITC 08), IEEE CS Press, 2008, paper 34.1.
10. "Hierarchical Scan Description Language (HSDL)," ASSET InterTech; , 1992.
11. "VASG: VHDL Analysis and Standardization Group," IEEE; http://www.eda.orgvhdl-200x.
12. "The FreeHDL Project" ; http:/
8 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool