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Issue No. 05 - September/October (2010 vol. 27)
ISSN: 0740-7475
pp: 36-49
Michele Portolan , Bell Labs Ireland
Suresh Goyal , Alcatel-Lucent Bell Labs
Bradford Van Treuren , Alcatel-Lucent Bell Labs
Chen-Huan Chiang , Alcatel-Lucent Bell Labs
Tapan J. Chakraborty , Alcatel-Lucent Bell Labs
Thomas B. Cook , Alcatel-Lucent Bell Labs
<p>This article describes the New Scan Description Language (NSDL), which can efficiently describe embedded-testing resources for automated test generation. The authors evaluate NSDL in the context of the proposed IEEE P1687 standard. They conduct a theoretical analysis for each requirement of this standard and identify the NSDL code solution for each point. They also explain how NSDL naturally fits into an automated test flow.</p>
design and test, test generation, languages, built-in tests, testing strategies, testing tools, NSDL, IEEE P1687

T. J. Chakraborty, B. Van Treuren, S. Goyal, C. Chiang, M. Portolan and T. B. Cook, "A Common Language Framework for Next-Generation Embedded Testing," in IEEE Design & Test of Computers, vol. 27, no. , pp. 36-49, 2010.
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