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Issue No. 05 - September/October (2010 vol. 27)
ISSN: 0740-7475
pp: 4
ABSTRACT
<p>This issue of <it>D&#x0026;T</it> features five articles on next-generation design and test innovations and the associated problems that face the design-and-test community.</p>
INDEX TERMS
design and test, embedded testing, MPSoC, process variation, task mapping, timing analysis
CITATION

"Next-generation design and test innovations," in IEEE Design & Test of Computers, vol. 27, no. , pp. 4, 2010.
doi:10.1109/MDT.2010.110
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