Issue No. 05 - September/October (2010 vol. 27)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2010.110
<p>This issue of <it>D&T</it> features five articles on next-generation design and test innovations and the associated problems that face the design-and-test community.</p>
design and test, embedded testing, MPSoC, process variation, task mapping, timing analysis
"Next-generation design and test innovations," in IEEE Design & Test of Computers, vol. 27, no. , pp. 4, 2010.