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Issue No. 05 - September/October (vol. 27)
ISSN: 0740-7475
Call for Papers

Call for Papers (HTML)

pp. 1
From the EIC

Masthead (Abstract)

pp. 5
Ring Oscillator Variation Analysis

Measurement-Based Ring Oscillator Variation Analysis (Abstract)

Tetsushi Koide , Hiroshima University
Hans Mattausch , Hiroshima University
Norio Sadachika , Tsuneishi Shipbuilding
Shinya Izumi , Renesas Technology
Akihiro Kaya , Hiroshima University
Koh Johguchi , Hiroshima University
pp. 6-13

Table of Contents (PDF)

pp. 2
Task Mapping

Dynamic Task Mapping for MPSoCs (Abstract)

Fernando Gehm Moraes , Pontifícia Universidade Católica do Rio Grande do Sul
Ewerson Luiz de Souza Carvalho , Pontifícia Universidade Católica do Rio Grande do Sul
Ney Laert Vilar Calazans , Pontifícia Universidade Católica do Rio Grande do Sul
pp. 26-35
Next-Generation Embedded Testing

A Common Language Framework for Next-Generation Embedded Testing (Abstract)

Tapan J. Chakraborty , Alcatel-Lucent Bell Labs
Bradford Van Treuren , Alcatel-Lucent Bell Labs
Suresh Goyal , Alcatel-Lucent Bell Labs
Chen-Huan Chiang , Alcatel-Lucent Bell Labs
Michele Portolan , Bell Labs Ireland
Thomas B. Cook , Alcatel-Lucent Bell Labs
pp. 36-49
Failure Detection and Characterization

BIST to Detect and Characterize Transient and Parametric Failures (Abstract)

Sandip Kundu , University of Massachusetts at Amherst
Alodeep Sanyal , Synopsys
Syed M. Alam , Everspin Technologies
pp. 50-59
DAC 2010 Roundtable
Book Reviews

Spray-painting on the wall of EDA (Abstract)

Grant Martin , Tensilica
pp. 68-69
CEDA Currents

CEDA Currents (Abstract)

pp. 70-71
Conference Reports

Conference Reports (Abstract)

pp. 72-73
DATC Newsletter
TTTC Newsletter
The Last Byte

The ABCs of ITC (Abstract)

Ron Press , Mentor Graphics
pp. 80
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