The Community for Technology Leaders
Green Image
Issue No. 04 - July/August (2010 vol. 27)
ISSN: 0740-7475
pp: 78-79
<p>This month's Test Technology TC Newsletter features highlights of past events&#x2014;28th IEEE VLSI Test Symposium and 19th IEEE North Atlantic Test Workshop&#x2014;and upcoming events: 16th IEEE International On-Line Testing Symposium, 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, and 40th International Test Conference.</p>
DFT 2010, IOLTS 2010, ITC 2010, NATW 2010, VTS 2010
"Test Technology TC Newsletter", IEEE Design & Test of Computers, vol. 27, no. , pp. 78-79, July/August 2010, doi:10.1109/MDT.2010.91
85 ms
(Ver 3.3 (11022016))