Pages: pp. 78-79
Abstract—This month's Test Technology TC Newsletter features highlights of past events—11th IEEE Latin-American Test Workshop; Design, Automation and Test in Europe (DATE 2010)—and upcoming events: 3rd IEEE International Symposium on Hardware, and the 16th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop.
Keywords—DATE 2010, HOST 2010, IMS3TW 2010, LATW 2010
28–31 March 2010
Punta del Este, Uruguay
The Latin-American Test Workshop provides an annual forum for test and fault tolerance professionals and technologists from Latin America and all over the world to present and discuss various aspects of system, board, and component testing and fault tolerance with design, manufacturing, and field considerations in mind. LATW 2010 was held in Punta del Este, Uruguay. The workshop included a keynote address by Bernard Courtois (CMP, France), four invited talks, and two embedded tutorials. The technical program covered various areas, namely functional test and fault simulation; dealing with soft errors; design for test in nanoscale technologies; fault analysis and diagnosis; analog and mixed-signal test; software testing; dependability analysis; and board and system test.
8–12 March 2010
The DATE conference again proved its worldwide leadership status with attendees from 39 countries. Germany accounted for a fourth of the attendees, followed by the US and France. This year, China showed a substantial increase and ranked as number 4 of the participating countries. The number of attendees (1,300) again reached the high level of attendance as has been attained in previous years. The keynote address was given by Alberto Sangiovanni Vincentelli (University of California, Berkeley) and by Herman Eul (Infineon). Mark Horowitz (Stanford University) presented the keynote address for Cool Electronic Systems Day, and Dimitris Antoniadis (MIT) presented the keynote address for Nanoelectronics Day.
13–14 June 2010
The emergence of a globalized, horizontal semiconductor business model raises a set of concerns involving the security and trust of the information systems on which modern society is increasingly reliant for mission-critical functionality. Hardware-oriented security and trust (HOST) issues span a broad range including threats related to the malicious insertion of Trojan circuits designed, for example, to act as a "kill switch" to disable a chip, to IC piracy, and to attacks designed to extract encryption keys and IP from a chip. HOST covers security and trust issues in all types of electronic devices and systems such as ASICs, COTS, FPGAs, microprocessors/DSPs, and embedded systems. The mission of HOST is to provide a forum for the presentation and discussion of research that is of critical significance to the security of, and trust in, modern society's microelectronic-supported infrastructures.
The IEEE International Symposium on Hardware-Oriented Security and Trust (HOST 2010) provides an open forum for discussions on all issues related to hardware security and trust. Papers and presentations that address "hot topics"—such as, for example, Trojan detection and isolation; authenticating the foundry of origin, side channel analysis/attacks, watermarking, IP security and trust, hardware-focused cryptography, and FPGA design security—are of high interest to the symposium:
7–9 June 2010
One and a half decades ago, the IEEE Mixed-Signal Test Workshop (IMSTW) was inaugurated as a forum focused on test and design issues related to electronic systems with digital and analog components. In view of accelerated developments in heterogeneous system design and production, IMSTW was expanded in 2008 to include new topics that address test, design for test, reliability, and manufacturability of today's sensors and sensor-based systems, as well as emerging devices and systems. Renamed to include sensors and systems, IMS3TW aims to bring together a community of researchers working on the next-generation of devices, circuits, and systems. This year, IMS3TW will continue to address the traditional technology spectrum of IMSTW, in particular all aspects of analog, mixed-signal, and RF testing, but with increased attention to all aspects of current design complexity (e.g., parametric variability, power consumption, and temperature effects). To guarantee design robustness for the new generation of nanoelectronic devices, we need to exploit self-monitoring functionality (such as self-test/-calibration), allowing the circuit or system to adapt to varying circuit parameters or functional demands. The sensors focus of the workshop will highlight all aspects of built-in sensors for device adaptation, MEMS, and biomedical applications such as lab-on-chip and implantable devices.
I would appreciate input and suggestions about the newsletter from the test community. Please forward your ideas, contributions, and information on awards, conferences, and workshops to Mohammad Tehranipoor, Electrical and Computer Engineering Department, Univ. of Connecticut, 371 Fairfield Way, Storrs, CT 06269-2157; firstname.lastname@example.org.
Editor, TTTC Newsletter
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