Issue No. 03 - May/June (2010 vol. 27)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2010.72
<p>This month's Test Technology TC Newsletter features highlights of past events—11th IEEE Latin-American Test Workshop; Design, Automation and Test in Europe (DATE 2010)—and upcoming events: 3rd IEEE International Symposium on Hardware, and the 16th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop.</p>
DATE 2010, HOST 2010, IMS3TW 2010, LATW 2010
"Test Technology TC Newsletter," in IEEE Design & Test of Computers, vol. 27, no. , pp. 78-79, 2010.