The Community for Technology Leaders
Green Image
Issue No. 03 - May/June (2010 vol. 27)
ISSN: 0740-7475
pp: 78-79
<p>This month's Test Technology TC Newsletter features highlights of past events&#x2014;11th IEEE Latin-American Test Workshop; Design, Automation and Test in Europe (DATE 2010)&#x2014;and upcoming events: 3rd IEEE International Symposium on Hardware, and the 16th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop.</p>
DATE 2010, HOST 2010, IMS3TW 2010, LATW 2010
"Test Technology TC Newsletter", IEEE Design & Test of Computers, vol. 27, no. , pp. 78-79, May/June 2010, doi:10.1109/MDT.2010.72
108 ms
(Ver 3.1 (10032016))