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Issue No. 03 - May/June (2010 vol. 27)
ISSN: 0740-7475
pp: 54-61
Manish Sharma , Mentor Graphics, Wilsonville
Chris Schuermyer , Mentor Graphics, Wilsonville
Brady Benware , Mentor Graphics, Wilsonville
<p>The cost and cycle time for determining the root cause of yield loss continues to increase as semiconductor technology scales down. A new technique, Axiom, helps yield and product engineers determine the root cause of loss directly from diagnosis results. Consequently, root-cause cycle time is dramatically reduced, resulting in a higher physical-failure analysis success rate and reduced costs.</p>
Axiom, design and test, test failure data, yield loss, diagnosis-driven yield analysis

B. Benware, C. Schuermyer and M. Sharma, "Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis," in IEEE Design & Test of Computers, vol. 27, no. , pp. 54-61, 2009.
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