Issue No. 03 - May/June (2010 vol. 27)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2010.74
<p>This issue of <it>D&T</it> includes five articles on various aspects of testing. The issue leads off with a tutorial on software-based self-testing of microprocessors, followed by four in-depth articles on aspects of test technology. This issue also features the second part of a Perspectives article on an NSF workshop. Columns include The Road Ahead, Book Reviews, and Conference Reports.</p>
design and test, fault diagnosis, process methodology, self-testing
"Enabling design and manufacturing through innovations in DFT," in IEEE Design & Test of Computers, vol. 27, no. , pp. 2, 2010.