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TABLE OF CONTENTS
Issue No. 03 - May/June (vol. 27)
ISSN: 0740-7475
From the EIC
Masthead

Masthead (PDF)

pp. 3

Table of Contents (PDF)

pp. c2
Testing and Diagnosis

Automatic Test Wrapper Synthesis for a Wireless ATE Platform (Abstract)

Sung-Yu Chen , National Tsing Hua University, Taiwan
Ying-Yen Chen , National Tsing Hua University, Taiwan
Jing-Jia Liou , National Tsing Hua University, Taiwan
Chun-Yu Yang , National Tsing Hua University, Taiwan
pp. 31-41

Feature-Ranking Methodology to Diagnose Design-Silicon Timing Mismatch (Abstract)

Li-C Wang , University of California, Santa Barbara , Santa Barbara
Magdy S. Abadir , Freescale, Austin
Pouria Bastani , University of California Santa Barbara, Santa Barbara
Nick Callegari , University of California Santa Barbara, Santa Barbara
pp. 42-53

Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis (Abstract)

Brady Benware , Mentor Graphics, Wilsonville
Chris Schuermyer , Mentor Graphics, Wilsonville
Manish Sharma , Mentor Graphics, Wilsonville
pp. 54-61
Perspectives

NSF Workshop on EDA: Past, Present, and Future (Part 2) (Abstract)

Robert Brayton , University of California, Berkeley
Jason Cong , University of California, Los Angeles
pp. 62-74
Conference Reports

Conference Reports (HTML)

Rohit Kapur , Synopsys
pp. 75

Concurrent checking for logic (HTML)

Scott Davidson , Sun Microsystems
pp. 80-81

Scaling: More than Moore's law (Abstract)

Andrew B. Kahng , University of California, San Diego
pp. 86-87
TTTC Newsletter
CEDA Currents

CEDA Currents (HTML)

pp. 82-85
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