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Issue No. 02 - March/April (2010 vol. 27)
ISSN: 0740-7475
pp: 36-43
Colin C. McAndrew , Freescale Semiconductor
Xin Li , GlobalFoundries
Ivica Stevanović , ABB Corporate Research Center
Gennady Gildenblat , Arizona State University
<p><it>Editor's note:</it></p><p>Correlating the statistics of process parameters with the statistics of electrical performance is a vital task in statistical modeling. This article describes a more general form of the backward propagation of variance (BPV) method, a numerical technique for iteratively solving the statistics of process parameters from the statistics of electrical performance within the behavior of models encapsulated in S<scp>pice</scp>.</p><p align="right"><it>&#x2014;Frank Liu, IBM Austin Research Lab</it></p>
backward propagation of variance, design and test, PSP model, Spice modeling, statistical modeling

C. C. McAndrew, X. Li, G. Gildenblat and I. Stevanović, "Extensions to Backward Propagation of Variance for Statistical Modeling," in IEEE Design & Test of Computers, vol. 27, no. , pp. 36-43, 2010.
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