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Issue No. 02 - March/April (vol. 27)
ISSN: 0740-7475
From the EIC
Compact Variability Modeling in Scaled CMOS Design

Modeling Process Variability in Scaled CMOS Technology (Abstract)

Samar K. Saha , University of Colorado at Colorado Springs
pp. 8-16

Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP (Abstract)

Binjie Cheng , University of Glasgow
Daryoosh Dideban , University of Glasgow
Negin Moezi , University of Glasgow
Campbell Millar , University of Glasgow
Gareth Roy , University of Glasgow
Xingsheng Wang , University of Glasgow
Scott Roy , University of Glasgow
Asen Asenov , University of Glasgow
pp. 26-35

Extensions to Backward Propagation of Variance for Statistical Modeling (Abstract)

Colin C. McAndrew , Freescale Semiconductor
Xin Li , GlobalFoundries
Ivica Stevanović , ABB Corporate Research Center
Gennady Gildenblat , Arizona State University
pp. 36-43

Compact Modeling of Variation in FinFET SRAM Cells (Abstract)

Darsen D. Lu , University of California, Berkeley
Chung-Hsun Lin , IBM Thomas J. Watson Research Center
Ali M. Niknejad , University of California, Berkeley
Chenming Hu , University of California, Berkeley
pp. 44-50
Feature Article

Power Supply Noise: A Survey on Effects and Research (Abstract)

Mohammad Tehranipoor , University of Connecticut, Storrs
Kenneth M. Butler , Texas Instruments
pp. 51-67

NSF Workshop on EDA: Past, Present, and Future (Part 1) (Abstract)

Robert Brayton , University of California, Berkeley
Jason Cong , University of California, Los Angeles
pp. 68-74
Conference Reports

Conference Reports (Abstract)

Rohit Kapur , Synopsys
pp. 75
CEDA Currents

CEDA Currents (HTML)

pp. 76-78
DATC Newsletter
TTTC Newsletter
Book Reviews
The Last Byte

'Tis the gift to be simple (Abstract)

Sani R. Nassif , IBM Research—Austin
pp. 84-86
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