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Issue No. 06 - November/December (vol. 26)
ISSN: 0740-7475

Table of Contents (PDF)

pp. c2
From the EIC
Call for Papers

Call for Papers (HTML)

pp. 4
Reliability Challenges in Nano-CMOS Design

Guest Editors' Introduction: Reliability Challenges in Nano-CMOS Design (HTML)

Yu Cao , Arizona State University
Jim Tschanz , Intel
Pradip Bose , IBM Thomas J. Watson Research Center
pp. 6-7

Modeling Low-k Dielectric Breakdown to Determine Lifetime Requirements (Abstract)

Linda Milor , Georgia Institute of Technology
Muhammad Bashir , Georgia Institute of Technology
pp. 18-27

Overcoming Early-Life Failure and Aging for Robust Systems (Abstract)

Young Moon Kim , Stanford University
Evelyn Mintarno , Stanford University
Yanjing Li , Stanford University
Subhasish Mitra , Stanford University
pp. 28-39

Sensor-Driven Reliability and Wearout Management (Abstract)

Eric Karl , Intel Portland Technology Development
Cheng Zhuo , University of Michigan
Dennis Sylvester , University of Michigan
David Blaauw , University of Michigan
Prashant Singh , University of Michigan
pp. 40-49

A Novel Simulation Fault Injection Method for Dependability Analysis (Abstract)

Dongwoo Lee , Korea Aerospace University
Jongwhoa Na , Korea Aerospace University
pp. 50-61

Reliability Challenges and System Performance at the Architecture Level (Abstract)

Jude A. Rivers , IBM Thomas J. Watson Research Center
Prabhakar Kudva , IBM Thomas J. Watson Research Center
pp. 62-73
Other Features

EOC: Electronic Building Blocks for Embedded Systems (Abstract)

Juha Röning , University of Oulu
Tero Vallius , University of Oulu
pp. 74-83

Accelerating Emulation and Providing Full Chip Observability and Controllability (Abstract)

Ioannis Mavroidis , Technical University of Crete
Iakovos Mavroidis , Technical University of Crete
Ioannis Papaefstathiou , Technical University of Crete
pp. 84-94

Conference Reports (HTML)

pp. 95

CEDA Currents (HTML)

pp. 100-101

The Last Byte: Too many reboots (Abstract)

Scott Davidson , Sun Microsystems
pp. 104
Annual Index

Annual Index (PDF)

pp. 0
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