Issue No. 05 - September/October (2009 vol. 26)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2009.123
W. Robert Daasch , Portland State University
C. Glenn Shirley , Portland State University
Amit Nahar , Texas Instruments
<p>Editor's note:</p><p>The quantity and complexity of data generated at each test manufacturing step can be daunting. This article, which emerged from a tutorial presented at ITC 2008, explains the application of statistics to help process that data and provides examples of how test has shifted from descriptive to predictive methods.</p><p align="right"><it>—Nur A. Touba, University of Texas</it></p>
statistical test, design and test, statistical modeling, multisite testing, burn-in, outlier identification, outlier screening, data mining
W. R. Daasch, A. Nahar and C. G. Shirley, "Statistics in Semiconductor Test: Going beyond Yield," in IEEE Design & Test of Computers, vol. 26, no. , pp. 64-73, 2009.