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Issue No. 05 - September/October (2009 vol. 26)
ISSN: 0740-7475
pp: 64-73
W. Robert Daasch , Portland State University
Amit Nahar , Texas Instruments
C. Glenn Shirley , Portland State University
<p>Editor's note:</p><p>The quantity and complexity of data generated at each test manufacturing step can be daunting. This article, which emerged from a tutorial presented at ITC 2008, explains the application of statistics to help process that data and provides examples of how test has shifted from descriptive to predictive methods.</p><p align="right"><it>&#x2014;Nur A. Touba, University of Texas</it></p>
statistical test, design and test, statistical modeling, multisite testing, burn-in, outlier identification, outlier screening, data mining
W. Robert Daasch, Amit Nahar, C. Glenn Shirley, "Statistics in Semiconductor Test: Going beyond Yield", IEEE Design & Test of Computers, vol. 26, no. , pp. 64-73, September/October 2009, doi:10.1109/MDT.2009.123
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