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Issue No. 04 - July/August (2009 vol. 26)
ISSN: 0740-7475
pp: 78-87
Yibo Chen , Pennsylvania State University
Yuan Xie , Pennsylvania State University
ABSTRACT
<p>Editor's note:</p><p>CMOS process variability is a major challenge in deep-submicron SoC designs. The variations in transistor parameters are complicating both timing and power consumption prediction. This article surveys recent progress in the statistical high-level synthesis area.</p><p>&#x2014;Philippe Coussy, Universit&#x00E9; de Bretagne-Sud</p>
INDEX TERMS
statistical high-level synthesis, design and test, process variation, parametric yield
CITATION
Yibo Chen, Yuan Xie, "Statistical High-Level Synthesis under Process Variability", IEEE Design & Test of Computers, vol. 26, no. , pp. 78-87, July/August 2009, doi:10.1109/MDT.2009.85
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