Issue No. 03 - May/June (2009 vol. 26)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2009.66
Past TTTC Events
10th IEEE Latin-American Test Workshop (LATW 09)
2–5 March 2009
LATW, which first began in Rio de Janeiro, Brazil, in 2000, celebrated its 10th anniversary this year. Over the past 10 years, LATW has visited Cancun, Montevideo, Natal, Cartagena, Salvador, Buenos Aires, Cuzco, and Puebla. LATW-2009 was held in Búzios, Brazil. The technical program included a keynote address by Kaushik Roy (Purdue University), an invited talk by Hans-Joachim Wunderlich (University of Stuttgart), two embedded tutorials, and technical papers on the test of SoCs and NoCs, ATPGs, analog and mixed-signal test and diagnosis, BIST, fault tolerance architectures and techniques, fault modeling, design verification and validation, and soft-error detection.
16th International Test Synthesis Workshop (ITSW 09)
23–25 March 2009
The ITSW-2009 technical program included two keynote addresses by Tim Cheng (University of California, Santa Barbara) and Anne Gattiker (IBM), two embedded tutorials, a panel on online testing, and 23 technical papers. The technical program covered a range of topics on VLSI testing, namely test compression, BIST, delay test, functional test and debug, fault tolerance and reliability, DFT, and industry practices.
Upcoming TTTC Events
27th IEEE VLSI Test Symposium (VTS 09)
3–7 May 2009
Santa Cruz, California
The IEEE VLSI Test Symposium explores emerging trends and novel concepts in test, verification, and validation of microelectronic circuits and systems, analog and RF circuits, digital circuits, FPGAs, embedded systems, and memory. In addition to the high-quality papers presented at VTS, the innovative-practices track and special sessions are popular among researchers from both academia and industry. The innovative-practices track highlights cutting-edge challenges faced by test practitioners and the innovative solutions employed to address them. Special sessions can include panels, embedded tutorials, or hot-topic presentations.
14th IEEE European Test Symposium (ETS 09)
25–29 May 2009
ETS is Europe's premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in the area of electronic-based circuit and system testing.
2nd IEEE International Workshop on Hardware-Oriented Security and Trust (HOST 09)
27 July 2009
San Francisco, California
The emergence of a globalized, horizontal semiconductor business model raises a set of concerns involving the security and trust of the information systems on which modern society is increasingly reliant for mission-critical functionality. Hardware-oriented security and trust (HOST) issues span a broad range including threats related to the malicious insertion of Trojan circuits designed, for example, to act as a "kill switch" to disable a chip, to IC piracy, to attacks designed to extract encryption keys and IP from a chip, and to malicious system disruption and diversion. HOST covers security and trust issues in all types of electronic devices and systems such as ASICs, COTS, FPGAs, microprocessors/DSPs, and embedded systems. The mission of HOST-2009 is to provide a forum for the presentation and discussion of research that is of critical significance to the security of, and trust in, modern society's microelectronic-supported infrastructures.
15th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW 09)
10–12 June 2009
The IEEE Mixed-Signal Test Workshop (IMSTW) was inaugurated almost 15 years ago as a forum focused on test and DFT issues related to systems encompassing digital and analog electrical signals. In view of accelerated developments in heterogeneous design and production, in 2008 IMSTW started to include new topics focusing on challenges and solutions associated with test, DFT, reliability, and manufacturability of heterogeneous types of emerging systems or those envisaged in the near to longer terms. Renamed to include sensors and systems, the new IMS3TW aims to bring research and technical expertise for the next generation of devices, circuits, and systems. IMS3TW will continue to address the traditional technology spectrum of IMSTW, particularly analog, mixed-signal, and RF testing, but with increased attention to all aspects of current design complexity (for example, parametric variability, power consumption, and temperature effects). To guarantee design robustness for the new generation of nanoelectronic devices, designers may need to exploit self-monitoring functionality (such as self test and calibration), allowing the circuit or system to adapt to varying circuit parameters or functional demands. Built-in sensors can play a crucial role to facilitate device adaptability and are therefore within the scope of IMS3TW.
Newsletter Editor's Invitation
I would appreciate input and suggestions about the newsletter from the test community. Please forward your ideas; contributions; and information on awards, conferences, and workshops to Mohammad Tehranipoor, Electrical and Computer Engineering Department, Univ. of Connecticut, 371 Fairfield Way, Storrs, CT 06269-2157; firstname.lastname@example.org.
Editor, TTTC Newsletter