The Community for Technology Leaders
Green Image
Issue No. 03 - May/June (2009 vol. 26)
ISSN: 0740-7475
pp: 78-86
Vladimir A. Zivkovic , NXP Semiconductors
Jan Schat , NXP Semiconductors
Frank van der Heyden , NXP Semiconductors
Geert Seuren , NXP Semiconductors
<p>This article describes test development for embedded mixed-signal and RF modules in core-based design. The test development approach is fully automated and encompasses a DFT architecture that supports an arbitrary test method. Fully compliant with existing IEEE test standards, the proposed approach has been used for test development and characterization of mixed-signal cores in several industrial products. Two SoC examples emphasize its benefits and performance.</p>
mixed-signal test, DFT architecture, computer-aided test, core-based test

G. Seuren, J. Schat, F. v. Heyden and V. A. Zivkovic, "Core-Based Testing of Embedded Mixed-Signal Modules in a SoC," in IEEE Design & Test of Computers, vol. 26, no. , pp. 78-86, 2009.
83 ms
(Ver 3.3 (11022016))