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Issue No. 03 - May/June (2009 vol. 26)
ISSN: 0740-7475
pp: 25-37
Ozgur Sinanoglu , Kuwait University
Anuja Sehgal , Nvidia
<p>Editor's note:</p><p>Containing production cost is a major concern for today's complex SoCs. One of the key contributors to production cost is test time and test data volume, for which numerous compression techniques were proposed. This article introduces a different approach to test data volume reduction, namely the use of modular test based on IEEE Std 1500 architecture, and it provides modeling, analysis, and quantification to support the proposed approach.</p><p align="right"><it>—Yervant Zorian, VirageLogic</it></p>
modular testing, monolithic testing, IEEE Std 1500, test data volume, SoC testing, test application time, logic cores

J. Fitzgerald, O. Sinanoglu, E. J. Marinissen, J. Rearick and A. Sehgal, "Test Data Volume Comparison: Monolithic vs. Modular SoC Testing," in IEEE Design & Test of Computers, vol. 26, no. , pp. 25-37, 2009.
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