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Issue No. 03 - May/June (2009 vol. 26)
ISSN: 0740-7475
pp: 6-15
Vivek Chickermane , Cadence Design Systems
Krishna Chakravadhanula , Cadence Design Systems
<p>Editor's note:</p><p>Standardized design and test practices enable automation. This article describes a methodology and corresponding tool set that combines automated support for IEEE Std 1500 and test data compression in one.</p><p align="right"><it>—Erik Jan Marinissen, IMEC</it></p>
IEEE Std 1500, core test, EDA, test data compression
Vivek Chickermane, Krishna Chakravadhanula, "Automating IEEE 1500 Core Test—An EDA Perspective", IEEE Design & Test of Computers, vol. 26, no. , pp. 6-15, May/June 2009, doi:10.1109/MDT.2009.47
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