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Issue No. 03 - May/June (vol. 26)
ISSN: 0740-7475

Table of Contents (PDF)

pp. c2
From the EIC
Call for Papers

Call for Papers (HTML)

pp. 5
Special Issue
IEEE Std 1500 and Its Usage - Part 2

Automating IEEE 1500 Core Test—An EDA Perspective (Abstract)

Vivek Chickermane , Cadence Design Systems
Krishna Chakravadhanula , Cadence Design Systems
pp. 6-15

Are IEEE-1500-Compliant Cores Really Compliant to the Standard? (Abstract)

Paolo Prinetto , Politecnico di Torino
Stefano Di Carlo , Politecnico di Torino
Alfredo Benso , Politecnico di Torino
pp. 16-24

Metamodels in Europe: Languages, Tools, and Applications (Abstract)

Francois Terrier , CEA LIST
Alberto Ferrari , Parades
Arnaud Cuccuru , CEA LIST
Albert Benveniste , INRIA Rennes
Daniela Cancila , CEA LIST
Alberto Sangiovanni-Vincentelli , University of California, Berkeley
Roberto Passerone , University of Trento
Werner Damm , Oldenburg University
Susanne Graf , Verimag
pp. 38-53

Metamodeling: An Emerging Representation Paradigm for System-Level Design (Abstract)

Alberto Sangiovanni-Vincentelli , University of California, Berkeley
Sandeep Kumar Shukla , Virginia Polytechnic and State University
Janos Sztipanovits , Vanderbilt University
Guang Yang , National Instruments
pp. 54-69
Other Features

Core-Based Testing of Embedded Mixed-Signal Modules in a SoC (Abstract)

Geert Seuren , NXP Semiconductors
Jan Schat , NXP Semiconductors
Frank van der Heyden , NXP Semiconductors
Vladimir A. Zivkovic , NXP Semiconductors
pp. 78-86

CEDA Currents (HTML)

pp. 88-90

DATC Newsletter (HTML)

pp. 91
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