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24-27 November 2008
The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board, and system testing with design, manufacturing, and field considerations in mind. The ATS-2008 program included two keynotes by Brian Stevens of National Semiconductor and Kunio Uchiyama of Hitachi, two invited talks, and 18 paper presentation sessions.
20-24 April 2009
DATE is the premier European event for designers; design automation users, researchers, and vendors; and specialists in hardware and software design, test, and manufacturing of electronic circuits and systems. It particularly emphasizes ICs and SoCs, reconfigurable hardware, and embedded systems, including embedded software. The five-day event consists of a conference with plenary invited papers, regular papers, panels, hot-topic sessions, tutorials, and workshops, plus two special focus days and a track for executives. The scientific conference is complemented by a commercial exhibition of the state of the art in design and test tools, methodologies, IP and design services, reconfigurable and other hardware platforms, embedded software, and industrial design experiences from different application domains (such as automotive, wireless, telecommunications, and multimedia applications). DATE 2009 has received a record number of submissions (more than 960) with a 30% increase in papers on industrial applications.
3-7 May 2009
Santa Cruz, California
The IEEE VLSI Test Symposium explores emerging trends and novel concepts in test, verification, and validation of microelectronic circuits and systems, analog and RF circuits, digital circuits, FPGAs, embedded systems, and memory. In addition to the high-quality papers presented at VTS, the innovative-practices track and special sessions are popular among researchers from both academia and industry. The innovative-practices track highlights cutting-edge challenges faced by test practitioners and the innovative solutions employed to address them. Special sessions can include panels, embedded tutorials, or hot topic presentations.
25-29 May 2009
ETS is Europe's premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in the area of electronic-based circuit and system testing.
8-10 October 2009
This symposium provides an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest.
Submissions deadline: 7 May 2009
I would appreciate input and suggestions about the newsletter from the test community. Please forward your ideas; contributions; and information on awards, conferences, and workshops to Mohammad Tehranipoor, Electrical and Computer Engineering Department, Univ. of Connecticut, 371 Fairfield Way, Storrs, CT 06269-2157; email@example.com.
Editor, TTTC Newsletter
For more details and free membership, browse the TTTC Web page: http://tab.computer.org/tttc.