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Issue No. 01 - January/February (2009 vol. 26)
ISSN: 0740-7475
pp: 18-25
Benoit Nadeau-Dostie , LogicVision
Saman M.I. Adham , LogicVision
Russell Abbott , LogicVision
ABSTRACT
IEEE Std 1500 enables automation and hence allows for easier and faster integration of embedded cores into an SoC. This article describes an automated test development system based on the concept of embedded test.
INDEX TERMS
hierarchical test, embedded test, IEEE Std 1500, core isolation, shared isolation, WSP, TAP
CITATION

R. Abbott, S. M. Adham and B. Nadeau-Dostie, "Improved Core Isolation and Access for Hierarchical Embedded Test," in IEEE Design & Test of Computers, vol. 26, no. , pp. 18-25, 2009.
doi:10.1109/MDT.2009.13
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