Issue No. 01 - January/February (2009 vol. 26)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2009.13
Benoit Nadeau-Dostie , LogicVision
Saman M.I. Adham , LogicVision
Russell Abbott , LogicVision
IEEE Std 1500 enables automation and hence allows for easier and faster integration of embedded cores into an SoC. This article describes an automated test development system based on the concept of embedded test.
hierarchical test, embedded test, IEEE Std 1500, core isolation, shared isolation, WSP, TAP
R. Abbott, S. M. Adham and B. Nadeau-Dostie, "Improved Core Isolation and Access for Hierarchical Embedded Test," in IEEE Design & Test of Computers, vol. 26, no. , pp. 18-25, 2009.