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Issue No. 01 - January/February (2009 vol. 26)
ISSN: 0740-7475
pp: 18-25
Russell Abbott , LogicVision
Saman M.I. Adham , LogicVision
Benoit Nadeau-Dostie , LogicVision
ABSTRACT
IEEE Std 1500 enables automation and hence allows for easier and faster integration of embedded cores into an SoC. This article describes an automated test development system based on the concept of embedded test.
INDEX TERMS
hierarchical test, embedded test, IEEE Std 1500, core isolation, shared isolation, WSP, TAP
CITATION
Russell Abbott, Saman M.I. Adham, Benoit Nadeau-Dostie, "Improved Core Isolation and Access for Hierarchical Embedded Test", IEEE Design & Test of Computers, vol. 26, no. , pp. 18-25, January/February 2009, doi:10.1109/MDT.2009.13
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