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Issue No. 01 - January/February (2009 vol. 26)
ISSN: 0740-7475
pp: 8-17
Yervant Zorian , Virage Logic
ABSTRACT
IEEE Std 1500 enables modular SoC testing, not only for core-based testing, but also for divide-and-conquer test generation and test reuse. This article provides a brief tutorial on the standard and illustrates its usage through two application case studies.
INDEX TERMS
IEEE Std 1500, SoC, manufacturing test, modular testing, wrapper, test access mechanism
CITATION
Yervant Zorian, Erik Jan Marinissen, "IEEE Std 1500 Enables Modular SoC Testing", IEEE Design & Test of Computers, vol. 26, no. , pp. 8-17, January/February 2009, doi:10.1109/MDT.2009.12
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