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Issue No.01 - January/February (vol.26)
ISSN: 0740-7475
pp. 2-3
From the EIC
Special Issue on IEEE Std 1500 and Its Usage
Laung-Terng Wang , SynTest Technologies
Ravi Apte , SynTest Technologies
Shianling Wu , SynTest Technologies
Boryau Sheu , SynTest Technologies
Kuen-Jong Lee , National Cheng Kung University
Xiaoqing Wen , Kyushu Institute of Technology
Wen-Ben Jone , University of Cincinnati
Jianghao Guo , University of Cincinnati
Wei-Shin Wang , Silicon Integrated Systems
Hao-Jan Chao , SynTest Technologies
Jinsong Liu , SynTest Technologies
Yanlong Niu , SynTest Technologies
Yi-Chih Sung , SynTest Technologies
Chi-Chun Wang , SynTest Technologies
Fangfang Li , SynTest Technologies
pp. 26-35
Rohit Kapur , Synopsys
Paul Reuter , Mentor Graphics
Sandeep Bhatia , Cadence Design Systems
Brion Keller , Cadence Design Systems
pp. 36-43
Stylianos Diamantidis , Globetech Solutions
Iraklis Diamantidis , Globetech Solutions
pp. 44-51
Fault Detection
Crossbar-Based Nanoarchitectures
Wenjing Rao , University of Illinois at Chicago
Alex Orailoglu , University of California, San Diego
Ramesh Karri , Polytechnic University of NYU
pp. 68-77
Resizing for Design Reuse
Timothée Levi , LIMMS, University of Tokyo
Jean Tomas , Bordeaux University
Noëlle Lewis , Bordeaux University
Pascal Fouillat , Ecole Nationale Supérieure d'Electronique de Bordeaux
pp. 78-87
Book Reviews
Scott Davidson , Sun Microsystems
pp. 98-101
Test Technology Newsletter
The Last Byte
Miron Abramovici , Independent consultant
Al Crouch , Asset InterTech
pp. 104
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