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Issue No. 01 - January/February (vol. 26)
ISSN: 0740-7475

Table of Contents (PDF)

pp. 2-3
From the EIC
Special Issue on IEEE Std 1500 and Its Usage

Turbo1500: Core-Based Design for Test and Diagnosis (Abstract)

Jianghao Guo , University of Cincinnati
Shianling Wu , SynTest Technologies
Hao-Jan Chao , SynTest Technologies
Yi-Chih Sung , SynTest Technologies
Wei-Shin Wang , Silicon Integrated Systems
Laung-Terng Wang , SynTest Technologies
Wen-Ben Jone , University of Cincinnati
Ravi Apte , SynTest Technologies
Xiaoqing Wen , Kyushu Institute of Technology
Yanlong Niu , SynTest Technologies
Kuen-Jong Lee , National Cheng Kung University
Fangfang Li , SynTest Technologies
Chi-Chun Wang , SynTest Technologies
Boryau Sheu , SynTest Technologies
Jinsong Liu , SynTest Technologies
pp. 26-35

CTL and Its Usage in the EDA Industry (Abstract)

Paul Reuter , Mentor Graphics
Sandeep Bhatia , Cadence Design Systems
Rohit Kapur , Synopsys
Brion Keller , Cadence Design Systems
pp. 36-43
Fault Detection
Crossbar-Based Nanoarchitectures

Logic Mapping in Crossbar-Based Nanoarchitectures (Abstract)

Wenjing Rao , University of Illinois at Chicago
Ramesh Karri , Polytechnic University of NYU
Alex Orailoglu , University of California, San Diego
pp. 68-77
Resizing for Design Reuse

A CMOS Resizing Methodology for Analog Circuits (Abstract)

Pascal Fouillat , Ecole Nationale Supérieure d'Electronique de Bordeaux
Noëlle Lewis , Bordeaux University
Jean Tomas , Bordeaux University
Timothée Levi , LIMMS, University of Tokyo
pp. 78-87
Book Reviews

A second course on testing (Abstract)

Scott Davidson , Sun Microsystems
pp. 98-101
Test Technology Newsletter

Test Technology Newsletter (HTML)

pp. 102-103
The Last Byte

We need more standards like IEEE 1500 (Abstract)

Al Crouch , Asset InterTech
Miron Abramovici , Independent consultant
pp. 104
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