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Issue No. 06 - November-December (vol. 25)
ISSN: 0740-7475
High-Performance Switches
Call for Papers

Special Issue on 3D IC Design and Test (HTML)

David Kung , (IBM Research)
Yuan Xie , (Pennsylvania State University)
pp. 505
From the EIC
Wafer-Level Test

Wafer Test Methods to Improve Semiconductor Die Reliability (Abstract)

William R. Mann , Rockwell International (Retired)
pp. 528-537
High-Performance Switches

Defect Tolerance for Nanoscale Crossbar-Based Devices (Abstract)

Mohammad Tehranipoor , University of Connecticut, Storrs
Reza M.P. Rad , University of Maryland, Baltimore County
pp. 549-559
Test Time Reduction

A Systematic Approach to Memory Test Time Reduction (Abstract)

Jen-Chieh Yeh , Industrial Technology Research Institute
Shuo-Fen Kuo , Realtek Semiconductor
Chao-Hsun Chen , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
pp. 560-570
Globally Asynchronous, Locally Synchronous Design

Multisynchronous and Fully Asynchronous NoCs for GALS Architectures (Abstract)

Abbas Sheibanyrad , TIMA Laboratory
Alain Greiner , Laboratoire d'Informatique de Paris 6
Ivan Miro-Panades , French Atomic Energy Commission, Grenoble
pp. 572-580

Application Scenarios in Streaming-Oriented Embedded-System Design (Abstract)

Stefan Valentin Gheorghita , Google Switzerland
Twan Basten , Eindhoven University of Technology
Henk Corporaal , Eindhoven University of Technology
pp. 581-589
Embedded Systems

Managing Security in FPGA-Based Embedded Systems (Abstract)

Ted Huffmire , Naval Postgraduate School
Brett Brotherton , Special Technologies Laboratory
Timothy Sherwood , University of California, Santa Barbara
Ryan Kastner , University of California, San Diego
Timothy Levin , Naval Postgraduate School
Thuy D. Nguyen , Naval Postgraduate School
Cynthia Irvine , Naval Postgraduate School
pp. 590-598
Design Automation Technical Committee Newsletter

DATC Newsletter (HTML)

pp. 599
Book Reviews

The two faces of high-level synthesis (Abstract)

Grant Martin , Tensilica
pp. 600-601
Test Technology TC Newsletter

Test Technology TC Newsletter (HTML)

pp. 602-603
CEDA Currents

CEDA Currents (HTML)

pp. 604-606
The Last Byte

Clarifying the record on testability cost functions (Abstract)

Melvin A. Breuer , University of Southern California
pp. 608-609
Annual Index

Annual Index (Abstract)

pp. 0
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