Issue No.04 - July-August (2008 vol.25)
Scott Davidson , Sun Microsystems
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2008.122
This is a review of <em>Data Mining: Concepts, Models, Methods, and Algorithms</em> (by Mehmed Kantardzic). Data mining is used to learn the characteristics of a population on the basis of a set of samples. One application of this in fabs is statistical postprocessing. As chips get bigger, test data volumes grow as well. It might be possible to mine this data to discover more about these chips and the processes to build them. This book is written at the right level for test engineers, and it doesn't include overly complex mathematical treatments of the concepts. Those in test can glean some good ideas here on how to apply data mining to get the most from their piles of test data, and on some of the tools that could help them.
data mining, test engineers, test data volumes, fuzzy logic, tools
Scott Davidson, "With pick and shovel through our data", IEEE Design & Test of Computers, vol.25, no. 4, pp. 382-383, July-August 2008, doi:10.1109/MDT.2008.122