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Issue No. 03 - May-June (vol. 25)
ISSN: 0740-7475
From the EIC
Special Issue Features

Functional Debug Techniques for Embedded Systems (Abstract)

Bart Vermeulen , NXP Semiconductors
pp. 208-215

Case Study on Speed Failure Causes in a Microprocessor (Abstract)

Kip Killpack , Intel
Pouria Bastani , University of California, Santa Barbara
pp. 224-230

Linking Statistical Learning to Diagnosis (Abstract)

Pouria Bastani , University of California, Santa Barbara
Li-C. Wang , University of California, Santa Barbara
Magdy S. Abadir , Freescale Semiconductor
pp. 232-239

Survey of Scan Chain Diagnosis (Abstract)

Yu Huang , Mentor Graphics
Ruifeng Guo , Mentor Graphics
Wu-Tung Cheng , Mentor Graphics
James Chien-Mo Li , National Taiwan University
pp. 240-248

Physical Techniques for Chip-Backside IC Debug in Nanotechnologies (Abstract)

Christian Boit , Berlin University of Technology
Rudolf Schlangen , Berlin University of Technology
Uwe Kerst , Berlin University of Technology
Ted Lundquist , DCG Systems
pp. 250-257

Overview of Debug Standardization Activities (Abstract)

Bart Vermeulen , NXP Semiconductors
Rolf Kühnis , Nokia
Neal Stollon , HDL Dynamics
Gary Swoboda , Texas Instruments
pp. 258-267

Thousand-Core Chips (Abstract)

David Yeh , Texas Instruments
Li-Shiuan Peh , Princeton University
Anant Agarwal , Massachusetts Institute of Technology and Tilera
Wen-mei Hwu , University of Illinois at Urbana-Champaign
pp. 272-278
DATC Newsletter

DATC Newsletter (HTML)

pp. 280
CEDA Currents

CEDA Currents (HTML)

pp. 282-283
Book Reviews

Learning to assert yourself (HTML)

Grant Martin , Tensilica
pp. 284-285
TTTC Newsletter

TTTC Newsletter (HTML)

pp. 286-287
The Last Byte

Bugs, moths, grasshoppers, and whales (Abstract)

Erik Jan Marinissen , NXP Semiconductors
pp. 288
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