Issue No. 02 - March-April (2008 vol. 25)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2008.53
Scott Davidson , Sun Microsystems
The value of test compression is that it has allowed us to move along a continuum between the extremes of ATPG and logic BIST, and has enabled us to find the right combination of test size, test coverage, and test time for a given situation. The basic similarity among different DFT techniques should make us feel confident that we are on the right track in our drive for efficient test compression.
vector generation, test compression, full scan, ATPG, logic BIST, output compression, non-fault-directed test, semi-fault-directed test
S. Davidson, "The commonality of vector generation techniques," in IEEE Design & Test of Computers, vol. 25, no. , pp. 200, 2008.