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Issue No. 02 - March-April (2008 vol. 25)
ISSN: 0740-7475
pp: 142-148
Ming Zhang , Intel
Kee Sup Kim , Intel
ABSTRACT
For SOC designs, it becomes very desirable to have IP blocks that come with their own test compression while having a second level of compression at the full-chip level. If done without careful analysis, this second-level compression logic can be subject to much greater aliasing and error masking because of the presence of X (unknown) values. This article presents a systematic way of designing the second-level compression logic. This method preserves the same X and multiple-error tolerance as the original X-Compact. The new method also successfully handles the use of identical cores, where there is a far higher chance of multiple errors and X values.
INDEX TERMS
hierarchical, test compression, SoC
CITATION
Ming Zhang, Kee Sup Kim, "Hierarchical Test Compression for SoC Designs", IEEE Design & Test of Computers, vol. 25, no. , pp. 142-148, March-April 2008, doi:10.1109/MDT.2008.39
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