The Community for Technology Leaders

Pages: pp. 103


Design, Automation and Test in Europe Conference (DATE 08)

10—14 March 2008


DATE is the main European event that brings together designers and design automation users; researchers; and vendors; as well as specialists in hardware and software design, test, and the manufacturing of electronic circuits and systems. DATE puts strong emphasis on ICs and SoCs, reconfigurable hardware, and embedded systems, including embedded software. This five-day event consists of a conference with plenary invited papers, regular papers, panels, hot-topic sessions, tutorials, and workshops, plus two special-focus days and a track for executives. The scientific conference is complemented by a commercial exhibition showing the state of the art in design and test tools, methodologies, IP and design services, reconfigurable and other hardware platforms, embedded software, and industrial design experiences from different application domains-for example, automotive, wireless, telecommunications, and multimedia applications.

11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS 08)

16—18 April 2008

Bratislava, Slovakia

This workshop provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of microelectronic circuits and systems.

26th IEEE VLSI Test Symposium (VTS 08)

27 April—1 May 2008

San Diego, California

The IEEE VLSI Test Symposium is an annual TTTC-sponsored conference that explores emerging trends and novel concepts in test, diagnosis, and verification of electronic circuits and systems. Major topics include system-in-package (SiP) test, microelectromechanical system (MEMS) test, automatic test generation, nanometer technologies test, infrastructure IP, defect tolerance, and many more. Please see the VTS Web site for a complete list of topics and other details.

7th Workshop on Test of Wireless Circuits and Systems (WTW 08)

4 May 2008

San Diego, California∼teresa/Main.htm

This workshop meets annually and provides high-quality papers on RF circuit testing. This year's workshop will be held in conjunction with the IEEE VLSI Test Symposium.

13th IEEE European Test Symposium (ETS 08)

25—29 May 2008

Lago Maggiore, Italy∼ets08

The IEEE European Test Symposium is Europe's premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in the area of electronic-based circuits and systems testing. This annual event has undergone healthy growth and continued quality improvement since it was first organized in 1996.


5th IEEE International Workshop on Silicon Debug and Diagnosis (SDD 08)

30 April—1 May 2008

San Diego, California

This workshop considers all issues related to debugging and diagnosis of systems and circuits, from prototype bring-up to volume production. Debugging and diagnosis can help improve yield, correct design functions, perform failure mode learning for R&D, or just get a working prototype. However, this work can be very difficult, owing to circuit and system complexity, packaging, limited physical access, shortened product creation cycle and time to market, the traditional focus on only pass/fail testing, and missing tool and equipment capabilities. New and efficient solutions for debugging and diagnosis will have a much-needed, highly visible impact on productivity.

Manuscript deadline: 7 March 2008


I would appreciate input and suggestions about the newsletter from the test community. Please forward your ideas, contributions, and information on awards, conferences, and workshops to Bruce C. Kim, Dept. of Electrical and Computer Engineering, Univ. of Alabama, 317 Houser Hall, Tuscaloosa, AL 35487-0286;

Bruce C. Kim

Editor, TTTC Newsletter


For more details and free membership, browse the TTTC Web page:

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