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Issue No. 01 - January-February (2008 vol. 25)
ISSN: 0740-7475
pp: 64-75
Dimitris Gizopoulos , University of Piraeus
Andreas Merentitis , University of Athens
Nektarios Kranitis , University of Athens
Antonis Paschalis , University of Athens
George Theodorou , University of Athens
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of embedded processors in SoCs. SBST is a nonintrusive approach that has the potential to provide high-quality at-speed testing at virtually zero performance, power, and circuit area overhead, using low-speed, low-cost external ATE. However, modern commercial processor cores are characterized by a high level of complexity, and their architectural features introduce test challenges that no single test methodology can effectively address. In this article, the authors combine self-test programs based on deterministic SBST methodologies (using high-level test development and gate-level-constrained ATPG test development) with verification-based self-test programs and directed random test program generation (RTPG), to develop a very effective hybrid-SBST test strategy. The authors applied this H-SBST strategy to the OpenRISC 1200 embedded processor. Experimental results show test coverage of more than 92%, demonstrating the effectiveness of the proposed methodology.
microprocessor testing, functional testing, software-based self-test, H-SBST, computer architecture, ATPG, RTPG
Dimitris Gizopoulos, Andreas Merentitis, Nektarios Kranitis, Antonis Paschalis, George Theodorou, "Hybrid-SBST Methodology for Efficient Testing of Processor Cores", IEEE Design & Test of Computers, vol. 25, no. , pp. 64-75, January-February 2008, doi:10.1109/MDT.2008.15
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