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Issue No. 01 - January-February (2008 vol. 25)
ISSN: 0740-7475
pp: 44-51
Rabi N. Mahapatra , Texas A&M University
John Mark Nolen , Texas A&M University
ABSTRACT
Much current research has focused on employing networks on chips (NoCs) for communication among numerous cores on large-scale SoCs. One side benefit of such designs is the potential to use this communication infrastructure with little modification for manufacturing test delivery. This article presents a test-scheduling approach for such designs that minimizes test time through high-speed test delivery over the network and lower-rate test execution at the target cores. To achieve this, the authors interleave test data over the network via time-division multiplexing (TDM). To demonstrate the utility of this approach, they present a test-scheduling algorithm and a simulated test case from ITC 2002 SoC benchmarks. The results show significant test time and I/O savings when compared to a single-clock approach.
INDEX TERMS
embedded-core testing, SoC, NoC, test access mechanism, TAM, scan test delivery, time-division multiplexing, TDM
CITATION
Rabi N. Mahapatra, John Mark Nolen, "Time-Division-Multiplexed Test Delivery for NoC Systems", IEEE Design & Test of Computers, vol. 25, no. , pp. 44-51, January-February 2008, doi:10.1109/MDT.2008.27
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