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Issue No. 01 - January-February (2008 vol. 25)
ISSN: 0740-7475
pp: 4
ABSTRACT
The design of next-generation RFICs remains challenging and demands innovation. In addition, with signal frequencies reaching tens of GHz, testing these circuits has created extraordinary challenges. This issue of D&T features a special issue on design and test of RFICs. This issue also includes an in-depth interview with Chris Rowen—founder, president, and CEO of Tensilica. In addition, there are four general-interest articles addressing diverse design and test issues.
INDEX TERMS
RFIC, Chris Rowen, NoC, runtime power monitoring, simultaneous switching noise, hybrid approach
CITATION

T. Cheng, "From the EIC," in IEEE Design & Test of Computers, vol. 25, no. , pp. 4, 2008.
doi:10.1109/MDT.2008.11
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