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Issue No. 01 - January-February (2008 vol. 25)
ISSN: 0740-7475
pp: 4
ABSTRACT
The design of next-generation RFICs remains challenging and demands innovation. In addition, with signal frequencies reaching tens of GHz, testing these circuits has created extraordinary challenges. This issue of D&T features a special issue on design and test of RFICs. This issue also includes an in-depth interview with Chris Rowen—founder, president, and CEO of Tensilica. In addition, there are four general-interest articles addressing diverse design and test issues.
INDEX TERMS
RFIC, Chris Rowen, NoC, runtime power monitoring, simultaneous switching noise, hybrid approach
CITATION
Tim Cheng, "From the EIC", IEEE Design & Test of Computers, vol. 25, no. , pp. 4, January-February 2008, doi:10.1109/MDT.2008.11
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