Issue No. 01 - January-February (2008 vol. 25)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2008.11
The design of next-generation RFICs remains challenging and demands innovation. In addition, with signal frequencies reaching tens of GHz, testing these circuits has created extraordinary challenges. This issue of D&T features a special issue on design and test of RFICs. This issue also includes an in-depth interview with Chris Rowen—founder, president, and CEO of Tensilica. In addition, there are four general-interest articles addressing diverse design and test issues.
RFIC, Chris Rowen, NoC, runtime power monitoring, simultaneous switching noise, hybrid approach
T. Cheng, "From the EIC," in IEEE Design & Test of Computers, vol. 25, no. , pp. 4, 2008.