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Issue No. 01 - January-February (vol. 25)
ISSN: 0740-7475
Special Issue Features
From the EIC

From the EIC (HTML)

pp. 4
Special Issue Features

Guest Editors' Introduction: The Evolution of RFIC Design and Test (HTML)

Craig Force , Texas Instruments
Bruce C. Kim , University of Alabama
pp. 6-8

Design of a Low-Noise UWB Transceiver SiP (Abstract)

Junwoo Lee , Hynix Semiconductor
Jaemin Kim , Korea Advanced Institute of Science and Technology
Joungho Kim , Korea Advanced Institute of Science and Technology
Changwook Yoon , Korea Advanced Institute of Science and Technology
Hyunjeong Park , Korea Advanced Institute of Science and Technology
Young-Jin Park , Korea Electrotechnology Research Institute
Jun So Pak , Korea Advanced Institute of Science and Technology
pp. 18-28

Decreasing Test Qualification Time in AMS and RF Systems (Abstract)

Smail Tedjini , Grenoble Institute of Technology
Yves Joannon , Grenoble Institute of Technology
Vincent Beroulle , Grenoble Institute of Technology
Chantal Robach , Grenoble Institute of Technology
Jean-Louis Carbonéro , STMicroelectronics
pp. 29-37
Other Features

Time-Division-Multiplexed Test Delivery for NoC Systems (Abstract)

Rabi N. Mahapatra , Texas A&M University
John Mark Nolen , Texas A&M University
pp. 44-51

Low-Impact Processor for Dynamic Runtime Power Management (Abstract)

Sri Parameswaran , University of New South Wales
Jorgen Peddersen , University of New South Wales
pp. 52-62

Hybrid-SBST Methodology for Efficient Testing of Processor Cores (Abstract)

Dimitris Gizopoulos , University of Piraeus
Andreas Merentitis , University of Athens
Nektarios Kranitis , University of Athens
Antonis Paschalis , University of Athens
George Theodorou , University of Athens
pp. 64-75

Simultaneous Switching Noise: The Relation between Bus Layout and Coding (Abstract)

André K. Nieuwland , NXP Semiconductors
Daniele Rossi , University of Bologna
Cecilia Metra , University of Bologna
pp. 76-86
Book Reviews

How to make your own processor architecture (HTML)

Scott Davidson , Sun Microsystems
pp. 96-98
CEDA Currents

CEDA Currents (Abstract)

pp. 100-101
DATC Newsletter

DATC Newsletter (HTML)

pp. 102
TTTC Newsletter

TTTC Newsletter (HTML)

pp. 103
The Last Byte

Changing times in the RF world (Abstract)

Bill Krenik , Texas Instruments
pp. 104
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