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Issue No. 05 - September-October (2007 vol. 24)
ISSN: 0740-7475
pp: 502-504
Sachin Sapatnekar , University of Minnesota
Leon Stok , IBM
ABSTRACT
The 44th Design Automation Conference (DAC) was held on 4-8 June 2007 in San Diego, California, and brought together design engineers, managers, developers, and researchers from industry and academia. This report provides a short summary of the technical trends in this premier event on electronic design automation and silicon solutions.
INDEX TERMS
Design Automation Conference, DAC, electronic design automation, automotive electronics, semiconductor industry
CITATION

L. Stok and S. Sapatnekar, "DAC Highlights," in IEEE Design & Test of Computers, vol. 24, no. , pp. 502-504, 2007.
doi:10.1109/MDT.2007.160
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