Issue No. 05 - September-October (2007 vol. 24)
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2007.165
Anne Gattiker , IBM Austin Research Lab
The 2006 IEEE International Test Conference (ITC) focused on the theme "Getting More Out of Test." This means ensuring product quality and reliability as cost efficiently as possible. In today's market environment, it also means taking test beyond its traditional role of separating good products from bad. The three articles in this special section, all written by well-received ITC 2006 authors, address ways to get more out of test. The first two articles provide specific examples of techniques for addressing the newly important diagnosis and debugging functions of test. The third article addresses test decision making more generally, and specifically suggests that exploring the psychology that underlies the decisions made by designers, DFT engineers, and test engineers could eventually help to get more out of test.
International Test Conference, ITC, test engineers, designers, diagnosis, debugging, electronic test
A. Gattiker, "Guest Editor's Introduction: Getting More Out of Test," in IEEE Design & Test of Computers, vol. 24, no. , pp. 474-475, 2007.