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TABLE OF CONTENTS
Issue No. 04 - July/August (vol. 24)
ISSN: 0740-7475
From the EIC
Special Issue Features

Guest Editors' Introduction: The State of the Art in Nanoscale CAD (HTML)

Cecilia Metra , University of Bologna
Fabrizio Lombardi , Northeastern University
pp. 302-303

An Overview of Nanoscale Devices and Circuits (Abstract)

Jing Huang , Sun Microsystems
Fabrizio Lombardi , Northeastern University
Mariam Momenzadeh , Northeastern University
pp. 304-311

Tracking Uncertainty with Probabilistic Logic Circuit Testing (Abstract)

John P. Hayes , University of Michigan
Igor L. Markov , University of Michigan
Smita Krishnaswamy , University of Michigan
pp. 312-321

Leakage Minimization Technique for Nanoscale CMOS VLSI (Abstract)

Kyung Ki Kim , Northeastern University
Nohpill Park , Oklahoma State University, Stillwater
Yong-Bin Kim , Northeastern University
Minsu Choi , University of Missouri-Rolla
pp. 322-330
Other Features

Practices in Mixed-Signal and RF IC Testing (Abstract)

Saghir A. Shaikh , Cadence Design Systems
pp. 332-339

Crosstalk- and SEU-Aware Networks on Chips (Abstract)

Érika Cota , Federal University of Rio Grande do Sul
Arthur Pereira Frantz , Datacom Telecommunications
Fernanda Lima Kastensmidt , Federal University of Rio Grande do Sul
Luigi Carro , Federal University of Rio Grande do Sul
Maico Cassel , Federal University of Rio Grande do Sul
pp. 340-350

ACID: Automatic Sort-Map Classification for Interactive Process Diagnosis (Abstract)

Federico Di Palma , University of Pavia
Guido Miraglia , STMicroelectronics
Giuseppe De Nicolao , University of Pavia
Oliver M. Donzelli , STMicroelectronics
pp. 352-361

Empirical Validation of Yield Recovery Using Idle-Cycle Insertion (Abstract)

Intaik Park , Stanford University
Donghwi Lee , Stanford University
Jeff Rearick , Advanced Micro Devices
pp. 362-372

Variation-Tolerant, Power-Safe Pattern Generation (Abstract)

V.R. Devanathan , Texas Instruments India
V. Kamakoti , Indian Institute of Technology, Madras
C.P. Ravikumar , Texas Instruments India
pp. 374-384
Departments

Book Review: An Assay of Biochips (HTML)

Sachin Sapatnekar , University of Minnesota
pp. 402-403

DATC Newsletter (HTML)

pp. 404-405

TTTC Newsletter (HTML)

pp. 407
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